Transmission Electron Microscopy (TEM) in Materials Science

An intermediate-level physics course by EPFLx

Course Description

Dive into the fascinating world of Transmission Electron Microscopy (TEM) with this comprehensive course offered by EPFLx. This intermediate-level physics course provides an in-depth exploration of TEM in materials science, unveiling the power of this remarkable analytical platform. Discover how TEM enables scientists to unlock structural and chemical information from the micrometer to sub-angstrom scale, making it an indispensable tool for materials analysis and nanoparticle research.

What Students Will Learn

  • A deep understanding of modern TEM and its applications in materials science
  • The connection between TEM optics, electron-matter interactions, and materials properties
  • How to identify suitable TEM techniques for specific scientific problems
  • Interpretation of TEM data presented in research articles
  • Appreciation of technological advances in TEM, including sub-angstrom resolution through aberration correction
  • Foundational knowledge for practical TEM training and advanced techniques

Pre-requisites

  • Basics of crystallography and diffraction
  • College-level optics, including the ability to construct ray diagrams
  • Fourier optics (advantageous)
  • Advanced crystallography (advantageous)
  • Solid-state physics (advantageous)

Course Content

  • Introduction to TEM and its capabilities
  • Diffraction basics, including Ewald sphere and reciprocal lattice concepts
  • Multi-beam diffraction and kinematical scattering
  • Dynamical effects in diffraction and imaging
  • Phase contrast imaging techniques
  • Electron-transparent sample analysis
  • Crystallinity measurement and atomic-resolution imaging
  • Nanoparticle analysis using TEM
  • Optics of TEM and electron-matter interactions
  • Materials properties insights through TEM
  • Technological advances in TEM, including sub-angstrom resolution
  • Introduction to advanced TEM techniques like dark-field holography and electron energy-loss spectroscopy

Who This Course Is For

  • Materials scientists and engineers looking to expand their analytical toolkit
  • Physics students interested in advanced microscopy techniques
  • Researchers working with nanoparticles or studying materials at the atomic scale
  • Professionals in fields such as semiconductors, metallurgy, and nanotechnology
  • Anyone seeking a strong theoretical foundation in TEM before practical training

Real-World Applications

  • Conduct cutting-edge materials research using TEM techniques
  • Analyze and characterize nanoparticles for various applications
  • Contribute to advancements in semiconductor technology and metallurgy
  • Improve product development in industries relying on materials science
  • Enhance quality control processes in manufacturing
  • Collaborate effectively with TEM operators and interpret results accurately
  • Design experiments utilizing TEM for materials analysis
  • Stay updated on the latest developments in microscopy and materials characterization

Syllabus

  1. Introduction (I)
  2. Introduction (II)
  3. Diffraction basics (I) - Ewald sphere, reciprocal lattice
  4. Diffraction basics (II) - multi-beam, kinematical scattering
  5. Diffraction and imaging - dynamical effects (I)
  6. Diffraction and imaging - dynamical effects (II)
  7. Phase contrast (I)
  8. Phase contrast (II)

Conclusion

By enrolling in this course, you'll gain invaluable insights into the world of transmission electron microscopy in materials science. From understanding the fundamentals of electron-matter interactions to exploring advanced TEM techniques, this course will equip you with the knowledge to interpret TEM data, appreciate technological advancements, and apply these skills to real-world materials analysis challenges. Don't miss this opportunity to enhance your expertise in one of the most powerful analytical tools available to materials scientists today!